測(cè)試力范圍

Qness 10 M: 20 gf - 10 kgf (0.196 - 98.07 N)
Qness 60 M: 0.25 gf - 62.5 kgf (0.00245 - 612.92 N)

測(cè)試方法

Vickers, Knoop, Brinell, Rockwell (option)

測(cè)試序列

全自動(dòng)/電子力應(yīng)用

Z軸

Dynamic, automated (CAS-Technic)

Z-axis travelling distance

150 mm (5.91“); Option: 260 mm (10,2“)

喉深

170 mm (6.69“)

轉(zhuǎn)塔

8-fold motorized tool changer
max. 3 hardness testing modules, max. 7 lenses

攝像頭系統(tǒng)

5 Mpixel - CMOS color, USB3.0

Optical system

Upright microscope with Koehler lighting

Aperture diaphragm

fix

物鏡

XLED 2x/2.5x/5x/ 10x/ 20x/50x/100x

Lens types

Standard (Achromat) and High Quality (Semi-apochromat) for hardness testing and microscopy
XLED for optimised Brinell hardness testing

視場(chǎng)(根據(jù)設(shè)備)

0.074x0.055 mm (100x) bis 2.80x2.10 mm (XLED 2)

測(cè)砧/XY試臺(tái)

Option: manual cross slide; Reduces test height by 26 mm

載物臺(tái)尺寸

? 100 mm (3.94“)
(cross slide: 135 x 135 mm)

Traverse path at cross slide

X 25, Y 25 mm (0.98 x 0.98“); Option X 50 x Y 50 mm (1.97 x 1.97“)

Control elements

Emergency stop, Start button, Joystick Z-axis

軟件

Qpix Control2 "M"

大允許工件重量

50 kg (110 lbs)

主機(jī)重量

55 kg (121.3 lbs)

Included basic equipment

Indenter Vickers ASTM + DAkkS; Lens 5x, 50x

界面

1 x USB 3.0

電源供應(yīng)

100 – 240 V ~1/N/PE, 45-65 Hz